Xiaoyan Liu, Ph.D. is a Professor and Associate Dean in the School of Integrated Circuits, Peking University. She received her B.Sc., M.Sc., and Ph.D. degrees in microelectronics from Peking University in 1988, 1991, and 2001, respectively. Her research is focused on the modeling and simulation of physical phenomena in the field of microelectronics. She proposed the simulation method for the charge trapping flash memory from cell to array and the Monte Carlo method to simulate the switch behaviors of RRAM. She developed methods to simulate tunneling effect, polarization switching, self-heating effect, trap behaviors, discrete impurity scattering, and electron-electron scattering. These methods can improve the accuracy and efficiency of device simulation.
Professor Liu has published over 200 research papers, many of which have appeared in top-tier journals and conferences, including IEDM, VLSI Symposium, IEEE Electron Device Letters. She is also a co-author of a book on microelectronics. She was selected for the Education Ministry's New Century Excellent Talents plan in 2006. She served on the committee of the IEEE Compound Semiconductor Devices & Circuits (2016-2018) and was in the Editorial Board of Journal of Semiconductor (2010-2019). She has served in the Technical Program Committee of international conferences including IEDM (2010-2011). She is serving as the editor of IEEE Transactions on Electron Devices.
